Monday, December 1, 2008

JT 2149 / MPV Geared to Combining Boundary-Scan and Functional Tests - International Business Times


JT 2149 / MPV Geared to Combining Boundary-Scan and Functional Tests
International Business Times, NY - 14 minutes ago
Forexample, a target circuit board (UUT) may contain elements, such asboard-edge connectors and non-boundary-scan logic clusters, which cannot beaccessed ...

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